Surface Inspection Systems
The next generation of single-objective analytical probing microscopes.
EHD-Vista70XL
The EHD-Vista70XL system consists of a camera, 7:1 zoom with fine focus, stand and lighting.
Specifically re-engineered to meet the needs of today's semiconductor probing station manufacturers, the new A-Zoom2 far surpasses its A-Zoom predecessor, delivering significantly improved optical performance and greather reliability. Dramatic gains in field-of-view, low-end magnification, optical zoom ratio, and numerical aperture, combine to provide a more powerful and effective optical system for on-wafer quality control and analysis.
Datasheet EHDvista70XL (
PDF: 1.836kb)
EHD-Vista125
Specifically re-engineered to meet the needs of today's semiconductor probing station manufacturers, the new A-Zoom2 far surpasses its A-Zoom predecessor, delivering significantly improved optical performance and greather reliability. Dramatic gains in field-of-view, low-end magnification, optical zoom ratio, and numerical aperture, combine to provide a more powerful and effective optical system for on-wafer quality control and analysis.
How to Buy
For more info and pricing information please contact us.