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Microscopy

Surface Inspection Systems

The next generation of single-objective analytical probing microscopes.


EHD-Vista70XL

The EHD-Vista70XL system consists of a camera, 7:1 zoom with fine focus, stand and lighting.

Specifically re-engineered to meet the needs of today's semiconductor probing station manufacturers, the new A-Zoom2 far surpasses its A-Zoom predecessor, delivering significantly improved optical performance and greather reliability. Dramatic gains in field-of-view, low-end magnification, optical zoom ratio, and numerical aperture, combine to provide a more powerful and effective optical system for on-wafer quality control and analysis.

 

EHD-Vista125

Specifically re-engineered to meet the needs of today's semiconductor probing station manufacturers, the new A-Zoom2 far surpasses its A-Zoom predecessor, delivering significantly improved optical performance and greather reliability. Dramatic gains in field-of-view, low-end magnification, optical zoom ratio, and numerical aperture, combine to provide a more powerful and effective optical system for on-wafer quality control and analysis.

 

How to Buy

For more info and pricing information please contact us.